Abstract
XRD data on the layered vanadium-substituted copper-chromium disulfides (CuCr1−x V x S2, x = 0−0.4) are compared with the data obtained by X-ray emission and photoelectron spectroscopies.
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Original Russian Text Copyright © 2011 by E. V. Korotaev, A. D. Fedorenko, L. N. Mazalov, N. A. Kryuchkova, V. V. Sokolov, I. Yu. Filatova, A. Yu. Pichugin, N. N. Peregudova, and S. A. Lavrukhina
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Translated from Zhurnal Strukturnoi Khimii, Vol. 52, Supplement, pp. S49–S54, 2011.
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Korotaev, E.V., Fedorenko, A.D., Mazalov, L.N. et al. XES investigation of the layered vanadium-substituted copper-chromium disulfides. J Struct Chem 52 (Suppl 1), 45–49 (2011). https://doi.org/10.1134/S0022476611070055
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DOI: https://doi.org/10.1134/S0022476611070055