We establish a direct relation between the I–V curves for highly transparent Josephson junctions in the voltage- and current-biased regimes. We demonstrate that the presence of sub-Ohmic dissipation at subgap voltages and temperatures yields the linear dependence of the average voltage \(\overline V \) on the bias current I exceeding the critical one \({{I}_{c}}\), in contrast to the square root dependence \(\overline V \propto \sqrt {I - {{I}_{c}}} \) in the Ohmic limit. Our predictions are compared with recent experimental findings.
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Galaktionov, A.V., Zaikin, A.D. Josephson Dynamics at High Transmissions: Voltage and Current Bias Limits. Jetp Lett. 118, 658–663 (2023). https://doi.org/10.1134/S0021364023602439
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DOI: https://doi.org/10.1134/S0021364023602439