In the explosive reaction of composites based on porous silicon with perchlorate oxidizers, a new effect has been discovered: the intensity accompanying the explosive reaction reaches its maximum value in tens of microseconds from the beginning of the explosive reaction, a sharp drop in intensity to zero then occurs for tens of microseconds (“zero shelf”), and short light and electromagnetic pulses are finally emitted. The recorded emission line width about 1 nm allows one to interpret a light pulse as a laser effect. The conditions for observing the zero shelf, the possible cause of its appearance, and the emission mechanism of a short light pulse are discussed.
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ACKNOWLEDGMENTS
We are grateful to Yu.M. Mikhailov, G.G. Savenkov, and V.P. Ulin for the advice on sample preparation, to Yu.K. Kurilenkov, V.E. Fortov, M.M. Glazov, and A.Ya. Vul’ for the discussion of the work, and to A.V. Nashchekin for the scanning electron microscopy study of the products of explosive reaction.
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Zegrya, G.G., Shashkov, E.V., Karpova, A.A. et al. Laser Effect in the Explosion of Porous Silicon. Jetp Lett. 114, 227–231 (2021). https://doi.org/10.1134/S0021364021160128
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DOI: https://doi.org/10.1134/S0021364021160128