It is known from experimental studies that the components of the permittivity tensor ε depend on layer thicknesses of multilayer thin films, and for nanometer layers, it is necessary to additionally consider the interlayer interfaces. This study provides an answer to the question of what is the reason for the influence of these interfaces on film properties. It is shown that the contribution of interband matrix elements for ferromagnetic films with off-diagonal components of the permittivity tensor determines the ratio between the diagonal and off-diagonal components of the tensor ε at a ferromagnetic layer thickness of about 10 nm.
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ACKNOWLEDGMENTS
We are grateful to the participants of the seminar at the Department of Magnetism of Moscow State University for stimulating discussions, and especially to A.V. Vedyaev, who drew our attention to the role of interfaces. We are also grateful to V. S. Zhandun for advice on calculating the permittivity tensor in density functional theory.
Funding
This work was supported by the Russian Science Foundation, project no. 21-12-00226, http://rscf.ru/project/21-12-00226/.
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Ovchinnikov, S.G., Maximova, O.A., Lyaschenko, S.A. et al. Role of Interfaces in the Permittivity Tensor of Thin Layers of a Ferromagnetic Metal. Jetp Lett. 114, 163–165 (2021). https://doi.org/10.1134/S0021364021150066
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DOI: https://doi.org/10.1134/S0021364021150066