Abstract
Infrared reflection and attenuated total reflection spectra are measured in the (111)Si/Bi2Se3 topological insulator film. The characteristic parameters of plasmons and phonons in the near-surface layers close to the Si–film interface are obtained from the dispersion analysis of the reflection spectra. It is found that the charge carrier density near the interface far exceeds that in the bulk. The dispersion laws for surface polaritons and waveguide modes are determined.
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Original Russian Text © N.N. Novikova, V.A. Yakovlev, I.V. Kucherenko, 2015, published in Pis’ma v Zhurnal Eksperimental’noi i Teoreticheckoi Fiziki, 2015, Vol. 102, No. 4, pp. 253–256.
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Novikova, N.N., Yakovlev, V.A. & Kucherenko, I.V. Infrared reflection and attenuated total reflection spectra in the Bi2Se3 topological insulator. Jetp Lett. 102, 226–229 (2015). https://doi.org/10.1134/S0021364015160092
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DOI: https://doi.org/10.1134/S0021364015160092