Abstract
Specific features of the proximity effect and Josephson behavior of submicron planar SNS junctions fabricated by electron beam lithography and shadow evaporation have been studied experimentally and theoretically. The critical current of the junctions has been found to drastically increase with a decrease in temperature, which is associated with a change in the effective size of the weak link owing to the additional SN interface.
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Original Russian Text © T.E. Golikova, F. Hübler, D. Beckmann, N.V. Klenov, S.V. Bakurskiy, M.Yu. Kupriyanov, I.E. Batov, V.V. Ryazanov, 2012, published in Pis’ma v Zhurnal Eksperimental’noi i Teoreticheskoi Fiziki, 2012, Vol. 96, No. 10, pp. 743–748.
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Golikova, T.E., Hübler, F., Beckmann, D. et al. Critical current in planar SNS Josephson junctions. Jetp Lett. 96, 668–673 (2013). https://doi.org/10.1134/S0021364012220043
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DOI: https://doi.org/10.1134/S0021364012220043