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Resonance microwave photoresistance of a two-subband electron system at large filling factors

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Abstract

The microwave photoresistance of a double GaAs quantum well with two occupied size-quantization sub-bands E 1 and E 2 has been studied at the temperatures T = 1.6–4.2 K in the magnetic fields B < 0.5 T. The microwave photoresistance of such a system has been found to have a maximum amplitude when the maximum of the magneto-intersubband oscillations with the number k = (E 2E 1)ℏωc coincides with the maximum or minimum of the ω/ωc oscillations, where ω is the microwave frequency and ωc is the cyclotron frequency. It has been shown that the resonance photoresistance that appears in the kth maximum of the magneto-intersubband oscillations is determined by the condition ℏω/(E 2E 1) = (j ± 0.2)/k, where k and j are positive integers.

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Correspondence to A. A. Bykov.

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Original Russian Text © A.A. Bykov, E.G. Mozulev, A.K. Kalagin, 2010, published in Pis’ma v Zhurnal Éksperimental’noĭ i Teoreticheskoĭ Fiziki, 2010, Vol. 92, No. 6, pp. 420–423.

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Bykov, A.A., Mozulev, E.G. & Kalagin, A.K. Resonance microwave photoresistance of a two-subband electron system at large filling factors. Jetp Lett. 92, 379–382 (2010). https://doi.org/10.1134/S0021364010180049

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