Abstract
XANES L 2,3 spectra and the reflection spectra of silicon, obtained in the case of the grazing incidence of radiation onto channel walls of microchannel plates, are studied. The channeling of secondary long-wavelength X-ray radiation was observed due to anomalous scattering in the vicinity of L edges of silicon absorption. The spectral composition of the secondary radiation at the microchannel output remains unchanged. The surfacebound propagation of X-ray fluorescence excited inside microchannels is observed for angles of incidence of less than θ ≈ θc/2.
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Original Russian Text © M.I. Mazuritskiy, P.V. Makhno, 2008, published in Pis’ma v Zhurnal Éksperimental’noĭ i Teoreticheskoĭ Fiziki, 2008, Vol. 88, No. 6, pp. 404–408.
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Mazuritskiy, M.I., Makhno, P.V. Anomalous X-ray scattering and channeling inside hollow microcapillary structures. Jetp Lett. 88, 351–354 (2008). https://doi.org/10.1134/S0021364008180021
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DOI: https://doi.org/10.1134/S0021364008180021