Abstract
In YBa2Cu3O7 − x films grown on sapphire bicrystal substrates, the Josephson junctions are prepared based on artificial grain boundaries formed by the turn of the crystal lattices about the [100] axis. The films are deposited by the laser ablation method on the buffer CeO2 layer. The critical film temperature reaches 88.5 K with a transition width of 1.5 K. Junctions from 2 to 3-μ m wide are integrated into the planar log-periodic antennas and their characteristics are measured at 77 K. The characteristic voltage I c R n reaches 570 μV. With exposure to external radiation at a frequency of 113 GHz, the Shapiro steps were observed on the current-voltage characteristic. The temperature sensitivity of this detector placed in a quasi-optical receiving unit is measured. At the modulation of the input radiation temperature 77 K/300 K, a response of more than 200 nV is observed at the detector output. At the modulation frequency, intrinsic noise is about 1 nV/Hz1/2, which corresponds to a temperature resolution of 1 K.
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Original Russian Text © M. Tarasov, E. Stepantsov, A. Kalabukhov, M. Kupriyanov, D. Winkler, 2007, published in Pis’ma v Zhurnal Éksperimental’noĭ i Teoreticheskoĭ Fiziki, 2007, Vol. 86, No. 11, pp. 828–831.
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Tarasov, M., Stepantsov, E., Kalabukhov, A. et al. Temperature sensitivity and noise of an HTSC Josephson detector on a sapphire bicrystal substrate at 77 K. Jetp Lett. 86, 718–720 (2008). https://doi.org/10.1134/S0021364007230075
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DOI: https://doi.org/10.1134/S0021364007230075