Abstract
The results of development, creation, and tests of an atom-probe prototype with femtosecond laser evaporation and a position-sensitive microchannel detector with delay lines for the tomographic (3D) analysis of chemical composition of materials are presented. The atom-probe tomography is based on the principle of atom-by-atom “disassembling” of materials and projection magnification, which was previously used in field-ion microscopy, as well as the time-of-flight mass spectrometry that is applied to each evaporated ion. The prototype characteristics (mass resolution, spatial resolution, and data-collection efficiency) were demonstrated in study of tungsten.
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Original Russian Text © S.V. Rogozhkin, A.A. Aleev, A.A. Lukyanchuk, A.S. Shutov, O.A. Raznitsyn, S.E. Kirillov, 2017, published in Pribory i Tekhnika Eksperimenta, 2017, No. 3, pp. 129–134.
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Rogozhkin, S.V., Aleev, A.A., Lukyanchuk, A.A. et al. An atom probe tomography prototype with laser evaporation. Instrum Exp Tech 60, 428–433 (2017). https://doi.org/10.1134/S002044121702021X
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DOI: https://doi.org/10.1134/S002044121702021X