A method for obtaining 3D images of a sample by detecting scattered X rays with a pinhole camera
- 44 Downloads
A method for studying the internal structure of a sample by detecting scattered synchrotron radiation using a pinhole camera is considered. The beam for imaging is shaped like a plane that intersects the sample. The characteristic spatial resolution of the method is 100 μm. Examples of the obtaining of images are presented, and the differences of this method from traditional techniques are discussed.
Unable to display preview. Download preview PDF.
- 3.Bonnin, A., Renier, M., Valade, J.-P., Beyrand, V., Voeten, D., Röper, M., and Tafforeau, P., Proc. 12th Bien. Conf. on High-Resolution X-Ray Diffraction and Imaging X-TOP, Villard-de-Lans, France: ESRF, 2014, p. 81.Google Scholar
- 4.Pakhnevich, A.V., Proc. 1st Int. Internet Conf. “Contemporary Mineralogy,” Kazan, 2013, p. 27.Google Scholar
- 5.Zubavichus, Ya.V., Mukhamedzhanov, E.Kh., and Senin, R.A., Priroda, 2013, no. 12, p. 37.Google Scholar