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Digital methods for the enhancement of the experimental contrast of defects in single-crystal structures (summary article)

  • Study of the Structure and Properties Physical Methods for the Study and Monitoring
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Inorganic Materials Aims and scope

Abstract

The most effective methods of digital processing based on the analysis of the brightness and frequency characteristics of the topographic and polarization-optical contrasts of structural defects are considered by example of single crystals of Si and 6H-SiC. The best results are obtained by using discrete wavelet analysis and images with a high dynamic range (HDR images). The possibility of removing the main noise-inducing factors—background inhomogeneities and granularity—on the experimental contrast by digital methods and of their modeling is shown. A procedure of the quantitative estimation for the efficiency of the digital processing and wavelet basis choice is proposed.

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Authors and Affiliations

  1. St. Petersburg State University of Service and Economics (Novgorod Branch), Veliky Novgorod, Russia

    V. A. Tkal’ & I. A. Zhukovskaya

Authors
  1. V. A. Tkal’
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  2. I. A. Zhukovskaya
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Correspondence to V. A. Tkal’.

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Original Russian Text © V.A. Tkal’, I.A. Zhukovskaya, 2013, published in Zavodskaya Laboratoriya. Diagnostika Materialov, 2013, Vol. 79, No. 4, pp. 28–37.

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Tkal’, V.A., Zhukovskaya, I.A. Digital methods for the enhancement of the experimental contrast of defects in single-crystal structures (summary article). Inorg Mater 50, 1444–1454 (2014). https://doi.org/10.1134/S0020168514150175

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  • DOI: https://doi.org/10.1134/S0020168514150175

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