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Wet chemical etching of the (111)In and \( \left( {\bar 1\bar 1\bar 1} \right) \)Sb planes of InSb substrates

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Abstract

This paper examines etching of the polar planes (111)In and \( \left( {\bar 1\bar 1\bar 1} \right) \)Sb of InSb wafers for liquid phase epitaxy in various etchants after mechanical and chemomechanical polishing. We describe procedures for polishing wafers and removing residual abrasive particles from the surface of polished wafers. A tartaric-acid-based etchant is shown to ensure a mirror-smooth finish of the \( \left( {\bar 1\bar 1\bar 1} \right) \)Sb surface, with no visible oxidation. Etching of the (111)In surface with a lactic-acid-based etchant produces planes inclined to the parent surface at an angle close to the misalignment angle between the surface and (111) plane.

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References

  1. Rogalsky, A., Infrared Detectors: An Overview, Infrared Phys. Technol., 2002, vol. 43, nos. 3–5, pp. 187–210.

    Article  Google Scholar 

  2. Bloom, I. and Nemirowsky, Y., Bulk Lifetime Determination of Etch Thinned InSb Wafers for Two-Dimensional Infrared Focal Plane Array, IEEE Trans. Electron Devices, 1992, vol. 39, no. 4, pp. 809–812.

    Article  CAS  Google Scholar 

  3. Mazurkevich, Ya.S., Zozulya, N.I., Kostyuk, L.S., and Zozulya, Yu.I., Etching and Properties of {111} InSb Planes, Izv. Akad, Nauk SSSR, Neorg. Mater., 1975, vol. 11, no. 4, pp. 611–617.

    CAS  Google Scholar 

  4. Gorelik, S.S. and Dashevskii, M.Ya., Materialovedenie poluprovodnikov i metallovedenie (Semiconductor Materials Research and Physical Metallurgy), Moscow: Metallurgiya, 1973.

    Google Scholar 

  5. Cho, Sl., Um, Y.H., and Kim, Y.K., Bi Epitaxy on Polar InSb (111)A/B Faces, J. Vac. Sci. Technol. A, 2002, vol. 20, no. 4, pp. 1191–1194.

    Article  CAS  Google Scholar 

  6. Tomashchik, V.M. and Chernyuk, O.V., Etching of GaSb in H2O2-HCl-CH3COOH Etchants, Fiz. Khim. Tverd. Tela, 2003, vol. 4, no. 3, pp. 543–546.

    Google Scholar 

  7. Kow-Ming Chang and Jiunn-Jye Luo, Meza Etching Characterization of InSb for High Density Array Application, J. Chin. Inst. Eng., 2007, vol. 30, no. 1, pp. 11–16.

    Article  CAS  Google Scholar 

  8. Lyuft, B.D., Khusid, L.B., Yassen, M.L., and Milyavskii, Yu.S., Chemical Polishing of Indium and Gallium Antimonides with H2O2-HF-Lactic Acid Solutions, Izv. Akad, Nauk SSSR, Neorg. Mater., 1984, vol. 20, no. 8, pp. 1260–1264.

    Google Scholar 

  9. Holmes, D.E. and Kamath, G.S., Growth Characteristics of LPE InSb and InGaSb, J. Electrochem. Soc., 1980, vol. 9, no. 1, pp. 95–110.

    Google Scholar 

  10. Huerta, J., Lopez, M., and Zelaya, O., MBE Growth of CdTe Epilayers on InSb (111) Substrates, Superfic. Vacio, 1999, no. 8, pp. 125–129.

  11. Simchi, H., Bahreani, Sh., and Saani, M.H., Cleaning InSb Wafer for Manufacturing InSb Detectors, Eur. Phys. J. Appl. Phys., 2006, vol. 33, pp. 1–4.

    Article  CAS  Google Scholar 

  12. Liu, J.K., Yuen, W.T., and Strading, R.A., Preparation of InSb Substrates for Molecular Beam Epitaxy, J. Vac. Sci. Technol. B, 1995, vol. 13, no. 4, pp. 1539–1545.

    Article  CAS  Google Scholar 

  13. Zhang, F., Busnaina, A.A., and Ahmadi, G., Partical Adhesion and Remova Chemical Mechanical Polishing and Post-Cmp Cleaning, J. Electrochem. Soc., 1999, no. 10, pp. 2665–2670.

  14. Chen, L.P., Lou, J.J., Liu, T.H., and Pang, Y.M., Evaluation of Low Dark Current InSb Photovoltaic Detectors, Solid-State Electron., 1992, vol. 35, no. 8, pp. 1081–1084.

    Article  CAS  Google Scholar 

  15. Banuelos, J-G., Basiuk, E., and Blesa, J-M., Morphology of Patterned Semiconductors III–V Surfaces Prepared by Spontaneous Anisotropic Chemical Etching, Rev. Mex. Fis., 2003, vol. 49, no. 4, pp. 310–316.

    CAS  Google Scholar 

  16. Kokorish, E.Yu. and Sheftal’, N.N., Dislocations in Semiconductor Crystals, Usp. Fiz. Nauk, 1960, vol. 72, pp. 480–494.

    Google Scholar 

  17. Ugai, Ya.A., Kurbanov, K.R., and Kirichenko, I.V., Deformation Layer Thickness in Mechanically Processed Semiconductor Materials, in Poluprovodnikovye materialy i ikh primenenie (Semiconductor Materials and Their Applications), Voronezh, 1974.

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Correspondence to Sh. O. Eminov.

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Original Russian Text © Sh.O. Eminov, Kh.D. Jalilova, E.A. Mamedova, 2011, published in Neorganicheskie Materialy, 2011, Vol. 47, No. 4, pp. 394–398.

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Eminov, S.O., Jalilova, K.D. & Mamedova, E.A. Wet chemical etching of the (111)In and \( \left( {\bar 1\bar 1\bar 1} \right) \)Sb planes of InSb substrates. Inorg Mater 47, 340–344 (2011). https://doi.org/10.1134/S0020168511040091

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  • DOI: https://doi.org/10.1134/S0020168511040091

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