Abstract
The compositions of source basalt and a number of basalt-based materials are studied by a local x-ray fluorescence and electronic probe analysis. The merit and possible applications of local x-ray spectrum analysis for analytic control in the manufacturing technique of basalt materials are considered.
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Original Russian Text © N.F. Drobot, V.A. Krenev, T.A. Kupriyanova, M.N. Filippov, S.V. Fomichev, 2009, published in Neorganicheskie Materialy, 2009, Vol. 45, No. 3, pp. 324–329.
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Drobot, N.F., Krenev, V.A., Kupriyanova, T.A. et al. Study of basalts by local x-ray spectrum analysis. Inorg Mater 45, 281–286 (2009). https://doi.org/10.1134/S0020168509030121
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DOI: https://doi.org/10.1134/S0020168509030121