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Application of electron microscopy and x-ray structural analysis for the determination of sizes of structural elements in nanocrystalline materials (Review)

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Abstract

The possibilities of determining the sizes of structural elements in various nanocrystalline materials by electron microscopy and X-ray structural analysis are analyzed. It is shown that these sizes depend on the fine structure of the materials and the procedures used. At a modern level of systematic development, to qualitatively determine the size characteristics of nanostructured materials, an integrated study with the use of various methods is advisable.

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Authors and Affiliations

  1. Moscow Institute of Steel and Alloys (State Technical University), Leninskii pr. 4, Moscow, 117936, Russia

    Yu. D. Yagodkin & S. V. Dobatkin

  2. Institute of Metallurgy and Materials Science, Russian Academy of Sciences, Leninskii pr. 49, Moscow, 117334, Russia

    S. V. Dobatkin

Authors
  1. Yu. D. Yagodkin
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  2. S. V. Dobatkin
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Original Russian Text © Yu.D. Yagodkin, S.V. Dobatkin, 2008, published in Zavodskaya Laboratoriya. Diagnostika materialov, 2008, Vol. 44, No. 14, pp. 38–49.

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Yagodkin, Y.D., Dobatkin, S.V. Application of electron microscopy and x-ray structural analysis for the determination of sizes of structural elements in nanocrystalline materials (Review). Inorg Mater 44, 1520–1530 (2008). https://doi.org/10.1134/S0020168508140070

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