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Electrical properties of p-Si1 − x Ge x Au-Based p-i-n structures and Schottky barriers

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We have studied the properties of Si1 − x Ge x -based p-i-n structures and Schottky barriers in which the i-region had been produced via compensation with gold. The results demonstrate that the use of a guard ring in p-Si1 − x Ge x 〈Au〉 structures reduces the room-temperature reverse leakage current by two to three orders of magnitude. Such structures have sufficiently small reverse currents and a barrier on the order of 0.75 eV. p-Si1 − x Ge x 〈Au〉-based guard-ring structures are suitable for the fabrication of IR and nuclear detectors.

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Correspondence to I. G. Atabaev.

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Original Russian Text © I.G. Atabaev, N.A. Matchanov, E.N. Bakhranov, M.U. Khazhiev, 2008, published in Neorganicheskie Materialy, 2008, Vol. 44, No. 7, pp. 775–780.

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Atabaev, I.G., Matchanov, N.A., Bakhranov, E.N. et al. Electrical properties of p-Si1 − x Ge x Au-Based p-i-n structures and Schottky barriers. Inorg Mater 44, 675–679 (2008). https://doi.org/10.1134/S0020168508070017

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  • DOI: https://doi.org/10.1134/S0020168508070017

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