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Method of integral equations in the spectral domain for the analysis of plane defects of a substrate

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Abstract

On the basis of a volume integral equation and the transition into a spectral domain, we develop an approach that permits one to study the scattering properties of plane objects of small thickness placed on a substrate. We perform the verification of the numerical scheme of the method by comparing the results with the discrete source method. Results illustrating the possibilities of the suggested method are presented.

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Authors and Affiliations

  1. Moscow State University, Moscow, Russia

    Yu. A. Eremin & V. V. Lopushenko

Authors
  1. Yu. A. Eremin
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  2. V. V. Lopushenko
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Correspondence to Yu. A. Eremin.

Additional information

Original Russian Text © Yu.A. Eremin, V.V. Lopushenko, 2014, published in Differentsial’nye Uravneniya, 2014, Vol. 50, No. 9, pp. 1187–1195.

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Eremin, Y.A., Lopushenko, V.V. Method of integral equations in the spectral domain for the analysis of plane defects of a substrate. Diff Equat 50, 1173–1181 (2014). https://doi.org/10.1134/S0012266114090055

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  • DOI: https://doi.org/10.1134/S0012266114090055

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