Skip to main content
Log in

Short Tests of Closures for Contact Circuits

  • Published:
Mathematical Notes Aims and scope Submit manuscript

Abstract

The problem of representing Boolean functions by two-pole contact circuits that are irredundant and admit short fault detection or diagnostic tests of closures of at most k contacts for a given positive integer k is considered. The following assertions are proved: for almost every Boolean function of n variables, the minimal length of a fault detection (diagnostic) test is equal to 2 (does not exceed 2k + 2, respectively).

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. O. B. Lupanov, Asymptotic Bounds on Complexity of Control Systems (Izd. Moskov. Univ., Moscow, 1984) [in Russian].

    Google Scholar 

  2. I. A. Chegis and S. V. Yablonskii, “Logical methods for monitoring the operation of electric circuits” in Trudy Mat. Inst. Steklova, Vol. 51: Collection of Papers on Mathematical Logics and Its Applications to Some Problems of Cybernetics (Izd. Akad. Nauk SSSR, Moscow, 1958), pp. 270–360 [in Russian].

    MathSciNet  Google Scholar 

  3. S. V. Yablonskii, “Reliability and control system monitoring,” in Proceedings of All-Union Seminar on Discrete Mathematics and Its Applications, January 31-February 2, 1984, Moscow (Izd. Moskov. Univ., Moscow, 1986), pp. 7–12 [in Russian].

    Google Scholar 

  4. S. V. Yablonskii, “Some problems of reliability and monitoring of control systems,” in Mathematical Problems of Cybernetics, No. 1 (Nauka, Moscow, 1988), pp. 5–25 [in Russian].

    Google Scholar 

  5. N. P. Red’kin, Reliability and Diagnostics of Schemes (Izd. Moskov. Univ., Moscow, 1992) [in Russian].

    MATH  Google Scholar 

  6. S. S. Kolyada, Upper Bounds for the Length of Fault Detection Tests for Schemes of Functional Elements, Cand. Sci. (Phys.-Math.) Dissertation (Moskov. Univ., Moscow, 2013) [in Russian].

    Google Scholar 

  7. Kh. A. Madatyan, “Full test for repeating contact circuits,” in Problems of Cybernetics, No. 23 (Nauka, Moscow, 1970), pp. 103–118 [in Russian].

    Google Scholar 

  8. N. P. Red’kin, “On complete checking tests for contact circuits,” in Methods of Discrete Analysis in the Study of Extremal Structures, No. 39 (Inst. Math. Sib. Otdel. Akad. Nauk SSSR, Novosibisk, 1983), pp. 80–87 [in Russian].

    Google Scholar 

  9. N. P. Red’kin, “On checking tests of closure and opening,” in Methods of Discrete Analysis in Optimization of Controlling Systems, No. 40 (Inst. Math. Sib. Otdel. Akad. Nauk SSSR, Novosibirsk, 1983), pp. 87–99 [in Russian].

    MATH  Google Scholar 

  10. D. S. Romanov, “On the synthesis of contact circuits that allow short fault detection tests,” in Uchen. Zap. Kazan. Univ.. Ser. Fiz.-Mat. Nauki (Izd. Kazan. Univ., Kazan, 2014), Vol. 156, pp. 110–115 [in Russian].

    Google Scholar 

  11. K. A. Popkov, “Tests of contact closure for contact circuits,” Diskret. Mat. 28 (1), 87–100 (2016) [Discrete Math. Appl. 26 (5), 299-308 (2016)].

    Article  Google Scholar 

  12. K. A. Popkov, “On fault detection tests of contact break for contact circuits,” Diskret. Mat. 29 (4), 66–86 (2017) [Discrete Math. Appl. 28(6), 369-383(2017)].

    Article  MathSciNet  Google Scholar 

  13. K. A. Popkov, “On diagnostic tests of contact break for contact circuits,” Preprint of Keldysh Institute of Applied Mathematics, Russian Academy of Sciences, No. 271 (2018).

    Google Scholar 

  14. N. P. Red’kin, “Diagnostic tests for contact circuits,” Vestnik Moskov. Univ. Ser. I Mat. Mekh. No. 2, 35–37 (2019) [Moscow Univ. Math. Bull. 74, 62-64 (2019)].

    Google Scholar 

  15. S.V. Yablonskii, Introduction to Discrete Mathematics (Nauka, Moscow, 1986) [in Russian].

    Google Scholar 

Download references

Funding

This work was supported by the Russian Science Foundation under grant 19-71-30004.

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to K. A. Popkov.

Additional information

Russian Text © The Author(s), 2020, published in Matematicheskie Zametki, 2020, Vol. 107, No. 4, pp. 591-603.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Popkov, K.A. Short Tests of Closures for Contact Circuits. Math Notes 107, 653–662 (2020). https://doi.org/10.1134/S0001434620030323

Download citation

  • Received:

  • Revised:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1134/S0001434620030323

Keywords

Navigation