Abstract
The trapped flux distribution in thin wafers of both polycrystalline and granular superconductors having large demagnetization and edge barriers of different heights is measured by means of polarized neutrons. It is shown that the nature of the critical state in polycrystalline wafers, unlike that in a ceramic wafer, is not described by the Bean model.
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Pis’ma Zh. Éksp. Teor. Fiz. 70, No. 12, 771–775 (25 December 1999)
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Zabenkin, V.N., Aksel’rod, L.A., Vorob’ev, A.A. et al. Magnetic flux distribution in type II superconductors with large demagnetization and a high edge barrier. Jetp Lett. 70, 787–791 (1999). https://doi.org/10.1134/1.568232
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DOI: https://doi.org/10.1134/1.568232