Abstract
The predicted quantitative relation between the density and trapping cross section of traps in Si3N4 and the Coulomb repulsion radius in the Wigner crystallization of carriers in localized states is observed experimentally. The absence of ESR for localized electrons and holes in Si3N4 is interpreted on the basis of a model of a resonance exchange interaction of electrons on account of tunneling via localized states.
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References
V. A. Gritsenko, JETP Lett. 64, 525 (1996).
V. A. Gritsenko, Structure and Electronic Structure of Amorphous Insulators in Silicon MIS Structures [in Russian], Novosibirsk, Nauka, 1993.
V. A. Gritsenko, Silicon Nitride in Electronics, Materials Science Monograp 34, Elsevier, North Holland, New York, 1988.
A. C. Arnett and B. H. Yun, Appl. Phys. Lett. 26, 94 (1975).
A. P. Aganin, V. M. Maslovskii, and A. P. Nagin, Mikroélektronika 17, 348 (1988).
V. A. Gritsenko and P. A. Pandur, Fiz. Tverd. Tela (Leningrad) 28, 3239 (1986) [Sov. Phys. Solid State 28, 1829 (1986)].
V. A. Gritsenko, Yu. P. Kostikov, and L. V. Khramova, Fiz. Tverd Tela (St. Petersburg) 34, 2424 (1993) [Sov. Phys. Solid State 34, 1300 (1993)].
G. Yu, G. Chen, and F. Zhang, Phys. Status Solidi B 152, 73 (1989).
D. E. Griscom, J. Non-Cryst. Solids 73, 51 (1985).
H. S. Withman and P. M. Lenahan, Appl. Phys. Lett. 51, 1007 (1987).
W. L. Warren, J. Kanicki, J. R. Robertson et al., J. Appl. Phys. 74, 4034 (1993).
V. A. Gritsenko and S. P. Sinitsa, in Properties of Metal-Insulator-Semiconductor Structures [in Russian], Nauka, Novosibirsk, 1976.
V. A. Gritsenko, E. E. Meerson, I. V. Travkov, and Yu. V. Goltvyanskii, Mikroélektronika 15, 92 (1987).
S. Manzini, J. Appl. Phys. 62, 3278 (1987).
V. A. Gritsenko and E. E. Meerson, Mikroélektronika 17, 249 (1988).
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Pis’ma Zh. Éksp. Teor. Fiz. 64, No. 7, 489–494 (10 October 1996)
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Gritsenko, V.A., Milov, A.D. Wigner crystallization of electrons and holes in amorphous silicon nitride. Antiferromagnetic ordering of localized electrons and holes as a result of a resonance exchange interaction. Jetp Lett. 64, 531–537 (1996). https://doi.org/10.1134/1.567230
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DOI: https://doi.org/10.1134/1.567230