Abstract
Ultrahigh spatial resolution of two-photon photoelectron images (as high as 3 nm, which is the best value that has been achieved to date in photoelectron microscopy with spatial resolution) is obtained when silicon nanotips are irradiated by the second harmonic of a pulsed femtosecond Ti: sapphire laser. In addition, the absolute value of the two-photon external photoeffect coefficient is measured.
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Zh. Éksp. Teor. Fiz. 115, 1680–1688 (May 1999)
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Sekatskii, S.K., Chekalin, S.V., Ivanov, A.L. et al. Ultrahigh-spatial-resolution photoelectron projection microscopy using femtosecond lasers. J. Exp. Theor. Phys. 88, 921–925 (1999). https://doi.org/10.1134/1.558872
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DOI: https://doi.org/10.1134/1.558872