Abstract
The yield and energy distribution of Cs atoms from cesium layers adsorbed on germanium-coated tungsten were measured, using the time-of-flight technique with a surface-ionization-based detector, as a function of the energy of bombarding electrons, germanium film thickness, the amount of adsorbed cesium, and substrate temperature. The threshold for the appearance of Cs atoms is ∼30 eV, which correlates well with the germanium 3d-level ionization energy. As the electron energy increases, the Cs atom yield passes through a broad maximum at ∼120 eV. For germanium film thicknesses from 0.5 to 2 monolayers, resonance Cs yield peaks were observed at electron energies of 50 and 80 eV, which can be related to the tungsten 5p and 5s core-level ionization energies. As the cesium coverage increases, the Cs atom yield passes through a flat maximum at monolayer coverage. The energy distribution of Cs atoms follows a bell-shaped curve. With increasing cesium coverage, this curve shifts to higher energies for thin germanium films and to lower energies for thick films. The Cs energy distribution measured at a substrate temperature T = 160 K exhibits two bell-shaped peaks, namely, a narrow peak with a maximum at ∼0.35 eV, associated with tungsten core-level excitation, and a broad peak with a maximum at ∼0.5 eV, deriving from the excitation of the germanium 3d core level. The results obtained can be described within a model of Auger-stimulated desorption.
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Translated from Fizika Tverdogo Tela, Vol. 47, No. 9, 2005, pp. 1715–1721.
Original Russian Text Copyright © 2005 by Ageev, Kuznetsov, Potekhina.
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Ageev, V.N., Kuznetsov, Y.A. & Potekhina, N.D. Electron-stimulated desorption of cesium atoms from cesium layers deposited on a germanium-coated tungsten surface. Phys. Solid State 47, 1784–1790 (2005). https://doi.org/10.1134/1.2045368
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DOI: https://doi.org/10.1134/1.2045368