Abstract
An aminonaphthylethenylpyridinium dye (ANEPPS) has been used to investigate the photoinduced charging of SiO2 surfaces via fluorescence shifts. Confocal microscopy allows for a localization of the charge distributions of better than 250 nm. The surface becomes negatively charged upon photoexcitation. This effect is enhanced by silicon nanocrystals (quantum dots) of less than 20 nm in diameter. Experiments suggest that ANEPPS occupies the SiO2 surface in an oriented way.
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From Optika i Spektroskopiya, Vol. 99, No. 2, 2005, pp. 297–303.
Original English Text Copyright © 2005 by Martin, Cichos, von Borczyskowski.
The text was submitted by the authors in English.
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Martin, J., Cichos, F. & von Borczyskowski, C. Confocal microscopy of electrostatic properties of Si quantum dots and silica surfaces by charge-sensitive dye molecules. Opt. Spectrosc. 99, 281–288 (2005). https://doi.org/10.1134/1.2034616
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DOI: https://doi.org/10.1134/1.2034616
Keywords
- Spectroscopy
- Silicon
- Microscopy
- SiO2
- Confocal Microscopy