Abstract
The yield of cesium (Cs) atoms during electron-stimulated desorption from a cesium layer adsorbed on a tungsten surface covered with a germanium film has been experimentally determined for the first time as a function of the electron energy, the germanium film thickness, the amount of adsorbed cesium, and the tungsten substrate temperature. The results are interpreted on the basis of a model of the Auger stimulated desorption.
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Translated from Pis’ma v Zhurnal Tekhnichesko\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l}\) Fiziki, Vol. 31, No. 6, 2005, pp. 66–72.
Original Russian Text Copyright © 2005 by Ageev, Kuznetsov.
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Ageev, V.N., Kuznetsov, Y.A. The yield of cesium atoms in electron-stimulated desorption from germanium-covered tungsten. Tech. Phys. Lett. 31, 249–251 (2005). https://doi.org/10.1134/1.1894448
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DOI: https://doi.org/10.1134/1.1894448