Abstract
A series of Si: Er electroluminescent diode structures is fabricated by sublimation molecular-beam epitaxy. The diode structures efficiently emit at a wavelength of 1.5 μm under conditions of p-n junction breakdown at room temperature. The effective cross section of excitation of Er3+ ions with hot carriers heated by the electric field of a reverse-biased p-n junction and the lifetime of Er3+ ions in the first excited state 4 I 13/2 are determined for structures that emit in a mixed breakdown mode and are characterized by the maximum intensity and excitation efficiency of the Er3+ electroluminescence.
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Translated from Fizika Tverdogo Tela, Vol. 47, No. 1, 2005, pp. 95–98.
Original Russian Text Copyright © 2005 by Remizov, Shmagin, Antonov, Kuznetsov, Krasil’nik.
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Remizov, D.Y., Shmagin, V.B., Antonov, A.V. et al. Effective excitation cross section and lifetime of Er3+ ions in Si: Er light-emitting diodes fabricated by sublimation molecular-beam epitaxy. Phys. Solid State 47, 98–101 (2005). https://doi.org/10.1134/1.1853454
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DOI: https://doi.org/10.1134/1.1853454