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Application of holographic interferometry to optical monitoring of solid surfaces

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Abstract

A new optical method is proposed for probing transition layers on solid surfaces, which combines the high precision inherent in holographic interferometry and the high sensitivity characteristic of optical microscopy using surface electromagnetic waves. The proposed technique has been numerically modeled for monochromatic radiation in the visible spectral range.

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Authors and Affiliations

  1. Scientific-Technological Center for Unique Instrument Building, Russian Academy of Sciences, Moscow, Russia

    G. N. Zhizhin, A. K. Nikitin, T. A. Ryzhova & A. P. Loginov

  2. Russian University of Peoples’ Friendship, Moscow, Russia

    G. N. Zhizhin, A. K. Nikitin, T. A. Ryzhova & A. P. Loginov

Authors
  1. G. N. Zhizhin
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  2. A. K. Nikitin
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  3. T. A. Ryzhova
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  4. A. P. Loginov
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Translated from Pis’ma v Zhurnal Tekhnichesko\({{P_{As_4 } } \mathord{\left/ {\vphantom {{P_{As_4 } } {P_{Ga} }}} \right. \kern-\nulldelimiterspace} {P_{Ga} }} = \gamma \) Fiziki, Vol. 30, No. 21, 2004, pp. 88–94.

Original Russian Text Copyright © 2004 by Zhizhin, Nikitin, Ryzhova, Loginov.

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Zhizhin, G.N., Nikitin, A.K., Ryzhova, T.A. et al. Application of holographic interferometry to optical monitoring of solid surfaces. Tech. Phys. Lett. 30, 927–929 (2004). https://doi.org/10.1134/1.1829345

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  • DOI: https://doi.org/10.1134/1.1829345

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