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Low-frequency relaxation processes in Pb5Ge3O11 ferroelectric crystals

  • Magnetism and Ferroelectricity
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Abstract

Measurements and analysis of the temperature and frequency dependences of permittivity and losses and of the electrical resistivity of Pb5Ge3O11 ferroelectric crystals at temperatures of 100 to 600 K and frequencies of 0.1 to 100 kHz are reported. The dielectric characteristics of the crystals exhibit, in addition to clearly pronounced anomalies near the Curie point T C=450 K, less distinct anomalous features of the relaxation character in the range 230–260 K. The data obtained on the effect of various factors (degree of crystal polarization, crystal annealing at different temperatures and in different environments, etc.) on the low-temperature anomalies serve as a basis for discussing the possible mechanisms responsible for these anomalies. It is concluded that the low-temperature dielectric anomalies originate from thermal carrier localization in defect levels in the band gap, which entail the formation of local polarized states.

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Authors and Affiliations

  1. Moscow State Institute of Radioengineering, Electronics, and Automation (Technical University), pr. Vernadskogo 78, Moscow, 119454, Russia

    A. A. Bush & K. E. Kamentsev

  2. Mendeleev University of Chemical Technology, Miusskaya pl. 9, Moscow, 123480, Russia

    M. V. Provotorov & T. N. Trushkova

Authors
  1. A. A. Bush
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  2. K. E. Kamentsev
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  3. M. V. Provotorov
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  4. T. N. Trushkova
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__________

Translated from Fizika Tverdogo Tela, Vol. 46, No. 9, 2004, pp. 1668–675.

Original Russian Text Copyright © 2004 by Bush, Kamentsev, Provotorov, Trushkova.

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Bush, A.A., Kamentsev, K.E., Provotorov, M.V. et al. Low-frequency relaxation processes in Pb5Ge3O11 ferroelectric crystals. Phys. Solid State 46, 1722–1729 (2004). https://doi.org/10.1134/1.1799193

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