Abstract
The sputtering of a lone cluster consisting of 27 copper atoms from a (0001) graphite surface bombarded by normally incident 100-and 200-eV Xe+ ions was simulated by the molecular dynamics method. The angular distributions of sputtered copper atoms and scattered xenon ions are discussed.
Similar content being viewed by others
References
G. V. Kornich, G. Betz, V. I. Zaporojtchenko, and A. I. Bazhin, Pis’ma Zh. Tekh. Fiz. 29(22), 33 (2003) [Tech. Phys. Lett. 29, 938 (2003)].
G. V. Kornich, G. Betz, V. I. Zaporojtchenko, and A. I. Bazhin, in Proceedings of the 16th International Conference on Surface-Ion Interaction, Moscow-Zvenigorod, 2003, Vol. 1, pp. 65–68.
G. V. Kornich, G. Betz, V. I. Zaporojtchenko, and A. I. Bazhin, Izv. Ross. Akad. Nauk, Ser. Fiz. 68, 304 (2004).
J. M. Haile, Molecular Dynamics Simulation-Elementary Methods (Wiley, New York, 1992).
G. V. Kornich, G. Betz, A. I. Bazhin, and V. G. Kornich, Izv. Ross. Akad. Nauk, Ser. Fiz. 66, 89 (2002).
Author information
Authors and Affiliations
Additional information
__________
Translated from Pis’ma v Zhurnal Tekhnichesko\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \) Fiziki, Vol. 30, No. 16, 2004, pp. 13–18.
Original Russian Text Copyright © 2004 by Kornich, Betz, Zaporojtchenko, Pugina.
Rights and permissions
About this article
Cite this article
Kornich, G.V., Betz, G., Zaporojtchenko, V.I. et al. Simulation of the interaction of low-energy ions with copper clusters on a graphite surface. Tech. Phys. Lett. 30, 669–671 (2004). https://doi.org/10.1134/1.1792308
Received:
Issue Date:
DOI: https://doi.org/10.1134/1.1792308