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Simulation of the interaction of low-energy ions with copper clusters on a graphite surface

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Abstract

The sputtering of a lone cluster consisting of 27 copper atoms from a (0001) graphite surface bombarded by normally incident 100-and 200-eV Xe+ ions was simulated by the molecular dynamics method. The angular distributions of sputtered copper atoms and scattered xenon ions are discussed.

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References

  1. G. V. Kornich, G. Betz, V. I. Zaporojtchenko, and A. I. Bazhin, Pis’ma Zh. Tekh. Fiz. 29(22), 33 (2003) [Tech. Phys. Lett. 29, 938 (2003)].

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Translated from Pis’ma v Zhurnal Tekhnichesko\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \) Fiziki, Vol. 30, No. 16, 2004, pp. 13–18.

Original Russian Text Copyright © 2004 by Kornich, Betz, Zaporojtchenko, Pugina.

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Kornich, G.V., Betz, G., Zaporojtchenko, V.I. et al. Simulation of the interaction of low-energy ions with copper clusters on a graphite surface. Tech. Phys. Lett. 30, 669–671 (2004). https://doi.org/10.1134/1.1792308

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  • DOI: https://doi.org/10.1134/1.1792308

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