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Simulation of low-energy argon ion scattering from surface copper clusters

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Abstract

The scattering of normally incident 200-eV Ar+ ions from individual clusters consisting of 13 and 39 copper atoms on a (0001) graphite surface was simulated by the molecular dynamics method. The angular distribution of scattered argon ions and their energies and reflection coefficients are discussed.

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References

  1. G. V. Kornich, G. Betz, V. I. Zaporojtchenko, and A. I. Bazhin, Pis’ma Zh. Tekh. Fiz. 29(22), 33 (2003) [Tech. Phys. Lett. 29, 938 (2003)].

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Authors and Affiliations

  1. Zaporozhye National Technical University, 69063, Zaporozhye, Ukraine

    G. V. Kornich, G. Betz, V. I. Zaporojtchenko & N. I. Belaya

  2. Institut für Allgemeine Physik, Technische Universität Wien, A-1040, Wien, Austria

    G. V. Kornich, G. Betz, V. I. Zaporojtchenko & N. I. Belaya

  3. Technische Fakultät, Christian Albrechts Universität, 24143, Kiel, Germany

    G. V. Kornich, G. Betz, V. I. Zaporojtchenko & N. I. Belaya

Authors
  1. G. V. Kornich
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  2. G. Betz
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  3. V. I. Zaporojtchenko
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  4. N. I. Belaya
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Additional information

__________

Translated from Pis’ma v Zhurnal Tekhnicheskoi Fiziki, Vol. 30, No. 13, 2004, pp. 34–39.

Original Russian Text Copyright © 2004 by Kornich, Betz, Zaporojtchenko, Belaya.

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Kornich, G.V., Betz, G., Zaporojtchenko, V.I. et al. Simulation of low-energy argon ion scattering from surface copper clusters. Tech. Phys. Lett. 30, 545–547 (2004). https://doi.org/10.1134/1.1783396

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  • DOI: https://doi.org/10.1134/1.1783396

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