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Edge-type Josephson junctions with silicon nitride spacer

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Abstract

Edge-type Josephson junctions with a silicon nitride spacer possessing small capacitance have been fabricated at the butt-joint of two superconducting niobium films. The main results of experimental investigation of the electrical properties of these structures are presented.

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Authors and Affiliations

  1. Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhni Novgorod, Russia

    S. N. Vdovichev, A. Yu. Klimov, Yu. N. Nozdrin & V. V. Rogov

Authors
  1. S. N. Vdovichev
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  2. A. Yu. Klimov
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  3. Yu. N. Nozdrin
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  4. V. V. Rogov
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Additional information

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Translated from Pis’ma v Zhurnal Tekhnichesko\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \) Fiziki, Vol. 30, No. 9, 2004, pp. 52–56.

Original Russian Text Copyright © 2004 by Vdovichev, Klimov, Nozdrin, Rogov.

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Vdovichev, S.N., Klimov, A.Y., Nozdrin, Y.N. et al. Edge-type Josephson junctions with silicon nitride spacer. Tech. Phys. Lett. 30, 374–376 (2004). https://doi.org/10.1134/1.1760859

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  • DOI: https://doi.org/10.1134/1.1760859

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