Abstract
It is shown that, by means of measuring the frequency dependence of the ellipticity of light reflected at the Brewster angle from the plane surface of a nonabsorbing dielectric, one can reveal on it nanostructural objects consisting of foreign atoms or molecules. They manifest themselves by the presence of size resonances, arising in these structures in a field of optical radiation because of the dipole-dipole interaction of the atoms (molecules). A theoretical justification of the experimental technique that takes into account the presence of a transition layer on the surface of the dielectric is proposed.
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Translated from Optika i Spektroskopiya, Vol. 96, No. 4, 2004, pp. 646–654.
Original Russian Text Copyright © 2004 by Gadomsky, Kadochkin.
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Gadomsky, O.N., Kadochkin, A.S. Method of optical near-field microscopy of foreign atoms on the surface of nonabsorbing dielectrics upon Brewster reflection of light. Opt. Spectrosc. 96, 586–594 (2004). https://doi.org/10.1134/1.1719150
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DOI: https://doi.org/10.1134/1.1719150