Abstract
The composition and mechanical stresses in Si1−x Gex nanoislands involved in multilayer and single-layer structures grown under the same conditions are determined using Raman spectroscopy. It is demonstrated that an increase in the content of silicon in the nanoislands contained in a multilayer structure does not enhance their relaxation (as compared to that in a single layer) due to the absence of a free surface. The experimental scattering spectrum of folded acoustic phonons contains bands with sufficiently small half-widths, which indicates high quality of the grown superlattices with nanoislands.
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Translated from Fizika Tverdogo Tela, Vol. 46, No. 1, 2004, pp. 88–90.
Original Russian Text Copyright © 2004 by Valakh, Dzhagan, Lytvyn, Yukhymchuk, Krasil’nik, Novikov, Lobanov.
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Valakh, M.Y., Dzhagan, V.N., Lytvyn, P.M. et al. Composition and elastic stresses in multilayer structures with Si1−x Gex nanoislands. Phys. Solid State 46, 85–88 (2004). https://doi.org/10.1134/1.1641928
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DOI: https://doi.org/10.1134/1.1641928