Skip to main content
SpringerLink
Log in

Application of the multifractal concept to characterization of the structure of composite films of fullerene C60 doped with CdTe

  • Published:
Technical Physics Letters Aims and scope Submit manuscript

Abstract

Peculiarities in the surface morphology of fullerene C60 based composite films containing various amounts of CdTe (0 to 100 mass %) were studied using methods of information theory. The characteristic size of the surface structure elements for these films amounts to 150–200 nm. It is shown that the concept of multifractals and the methods of multifractal analysis can be used for a quantitative comparison of the surface topography of such composite films. The multifractal analysis reveals the interval of fullerene based film compositions containing 15–20% CdTe, which corresponds to the most equilibrium conditions of film formation and provides for the most ordered material configuration. It was established that, using films with such compositions, fullerene-containing network nanostructures with a lateral resolution of 250 nm can be obtained by direct electron-beam lithography.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. M. S. Dresselhaus, G. Dresselhaus, and P. C. Elkund, Science of Fullerene and Carbon Nanotubes (Academic, San Diego, 1995), p. 965.

    Google Scholar 

  2. Optical and Electronic Properties of Fullerenes and Fullerene-Based Materials, Ed. by J. Shinar (Dekker, New York, 1999), p. 392.

    Google Scholar 

  3. T. L. Makarova, Fiz. Tekh. Poluprovodn. (St. Petersburg) 35(3), 257 (2001) [Semiconductors 35, 243 (2001)].

    Google Scholar 

  4. M. E. Gaevski, S. O. Kognovitskii, S. G. Konnikov, A. V. Nashchekin, et al., Nanotechnology, No. 11, 270 (2000).

  5. G. V. Vstovsky, A. G. Kolmakov, and V. F. Terentjev, Mater. Sci., No. 2 (9), 62 (1999).

  6. A. G. Kolmakov, V. V. Emtsev, W. V. Lundin, et al., Physica B (Amsterdam) 308–310, 1141 (2002).

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. Petersburg, 194021, Russia

    A. V. Nashchekin, A. G. Kolmakov, I. P. Soshnikov, N. M. Shmidt & A. V. Loskutov

  2. Baikov Institute of Metallurgy and Materials Science, Russian Academy of Sciences, Moscow, 117334, Russia

    A. V. Nashchekin, A. G. Kolmakov, I. P. Soshnikov, N. M. Shmidt & A. V. Loskutov

Authors
  1. A. V. Nashchekin
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. A. G. Kolmakov
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. I. P. Soshnikov
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. N. M. Shmidt
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. A. V. Loskutov
    View author publications

    You can also search for this author in PubMed Google Scholar

Additional information

__________

Translated from Pis’ma v Zhurnal Tekhnichesko\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \) Fiziki, Vol. 29, No. 14, 2003, pp. 8–14.

Original Russian Text Copyright © 2003 by Nashchekin, Kolmakov, Soshnikov, Shmidt, Loskutov.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Nashchekin, A.V., Kolmakov, A.G., Soshnikov, I.P. et al. Application of the multifractal concept to characterization of the structure of composite films of fullerene C60 doped with CdTe. Tech. Phys. Lett. 29, 575–577 (2003). https://doi.org/10.1134/1.1598554

Download citation

  • Received:

  • Issue Date:

  • DOI: https://doi.org/10.1134/1.1598554

Keywords

Search

Navigation