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Processing of intensities of electron scattering from amorphous silicon by methods of continuous wavelet analysis

  • Diffraction and Scattering of Ionizing Radiations
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Abstract

It is shown that intensities of electron scattering from amorphous silicon can be processed by the methods of wavelet analysis. The coordination radii for amorphous silicon at various annealing temperatures are calculated using the intensity distribution of coefficients of the wavelet transform.

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References

  1. A. F. Skryshevskii, Structure Analysis of Liquids and Amorphous Materials (Vysshaya Shkola, Moscow, 1980).

    Google Scholar 

  2. L. I. Tatarinova, Electron Diffraction from Amorphous Materials (Nauka, Moscow, 1972).

    Google Scholar 

  3. N. M. Astaf'eva, Usp. Fiz. Nauk 166(11), 1145 (1996) [Phys. Usp. 39, 1085 (1996)].

    Google Scholar 

  4. V. I. Vorob'ev and V. G. Gribulin, Theory and Practice of the Wavelet Transformation (VUS, St. Petersburg, 1999).

    Google Scholar 

  5. A. F. Khokhlov and A. I. Mashin, Allotropy of Silicon (Nizhegor. Gos. Univ., Nizhni Novgorod, 2002).

    Google Scholar 

  6. E. V. Chuprunov, A. F. Khokhlov, and M. A. Faddeev, Crystallography (Fizmatlit, Moscow, 2000).

    Google Scholar 

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Authors and Affiliations

  1. Nizhni Novgorod State University, pr. Gagarina 23, Nizhni Novgorod, 603950, Russia

    A. I. Mashin, O. A. Morozov, E. V. Smelova & E. A. Soldatov

Authors
  1. A. I. Mashin
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  2. O. A. Morozov
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  3. E. V. Smelova
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  4. E. A. Soldatov
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__________

Translated from Kristallografiya, Vol. 48, No. 4, 2003, pp. 598–601.

Original Russian Text Copyright © 2003 by Mashin, Morozov, Smelova, Soldatov.

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Mashin, A.I., Morozov, O.A., Smelova, E.V. et al. Processing of intensities of electron scattering from amorphous silicon by methods of continuous wavelet analysis. Crystallogr. Rep. 48, 547–550 (2003). https://doi.org/10.1134/1.1595176

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  • DOI: https://doi.org/10.1134/1.1595176

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