Abstract
It is demonstrated for X-ray diffraction from a bent crystal in the backscattering mode that the Bragg angle in the crystal can differ from the value in vacuum by ∼10−2. This difference exceeds the angular width of the region of total reflection for the CuKα radiation backscattered from the (220) plane of a silicon single crystal. The Bragg law modified with allowance for the refraction and crystal bending is presented.
Similar content being viewed by others
References
Z. G. Pinsker, X-ray Optics (Nauka, Moscow, 1982).
F. N. Chukhovskii, W. Z. Chang, and E. Förster, J. Appl. Phys. 77, 1843 (1995).
Author information
Authors and Affiliations
Additional information
__________
Translated from Pis’ma v Zhurnal Tekhnichesko\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \) Fiziki, Vol. 29, No. 6, 2003, pp. 38–41.
Original Russian Text Copyright © 2003 by Tchen.
Rights and permissions
About this article
Cite this article
Tchen, T. The Bragg law modified for X-ray diffraction from a bent crystal in the backscattering mode. Tech. Phys. Lett. 29, 235–236 (2003). https://doi.org/10.1134/1.1565644
Received:
Issue Date:
DOI: https://doi.org/10.1134/1.1565644