Abstract
Resonant inelastic X-ray scattering of highly oriented pyrolytic graphite (HOPG) is observed above the C 1s threshold at different polarization angles. It is shown that combining the polarization and excitation energy dependence of X-ray emission spectra makes it possible to perform quantitative band mapping selective to the chemical bonding (σ and π).
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From Pis’ma v Zhurnal Éksperimental’no\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \) i Teoretichesko\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \) Fiziki, Vol. 77, No. 2, 2003, pp. 114–117.
Original English Text Copyright © 2003 by Sokolov, Kurmaev, MacNaughton, Moewes, Skorikov, Finkelstein.
This article was submitted by the authors in English.
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Sokolov, A.V., Kurmaev, E.Z., MacNaughton, J. et al. σ and π-band dispersion of graphite from polarized resonant inelastic X-ray scattering measurements. Jetp Lett. 77, 108–111 (2003). https://doi.org/10.1134/1.1564230
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DOI: https://doi.org/10.1134/1.1564230