Abstract
Low-energy electron diffraction, thermodesorption spectroscopy, and contact potential difference techniques were used in a first study on the coadsorption of Sm and Yb atoms on the Si(111) surface. At comparatively low coverages, in both one-component adsorption systems of the rare-earth metal-Si(111) type and the two-component system (Sm + Yb)-Si(111), the same sequence of diffraction patterns of the (n×1) type, where n=3, 5, and 7, was observed. This indicates that Sm and Yb atoms occupy the same adsorption centers in a mixed film. At higher coverages, at which the \((\sqrt 3 \times \sqrt 3 )R30^\circ \) reconstruction forms in the case of the Sm-Si(111) system and the surface undergoes the 2×1 reconstruction in the Yb-Si(111) system, the structure of the mixed film is governed by the ytterbium coverage θ(Yb). At low ytterbium coverages, θ(Yb)<0.15, superposition of the \((\sqrt 3 \times \sqrt 3 )R30^\circ \) and (2×1) diffraction patterns is observed. For θ (Yb)>0.15, however, the former pattern disappears, whereas the latter persists. A comparison of this evolution of a binary adsorbed layer with the properties of the Sm-Si(111) and Yb-Si(111) systems indicates its anomalous character.
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Translated from Fizika Tverdogo Tela, Vol. 45, No. 3, 2003, pp. 548–554.
Original Russian Text Copyright © 2003 by Kuz’min, Mikha\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \)lov, Mittsev.
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Kuz’min, M.V., Mikhailov, N.V. & Mittsev, M.A. Formation and properties of a binary adsorbed layer in a two-component adsorption system (Sm + Yb)-Si(111). Phys. Solid State 45, 579–585 (2003). https://doi.org/10.1134/1.1562250
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DOI: https://doi.org/10.1134/1.1562250