Abstract
Czochralski-grown nitrogen-doped silicon crystals contain shallow thermal donors (STD) which are not present in reference crystals. In the course of annealing at 600 or 650°C, the STD concentration reaches saturation and this concentration scales with nitrogen content N as N1/2. This implies that an STD includes only one nitrogen atom and that the most likely model of the STD defect is the NOm complex of an interstitial nitrogen atom with m oxygen atoms. The number m is estimated as, on the average, m=3 from data on the temperature dependence of the equilibrium constant for the complex formation reaction
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Translated from Fizika Tverdogo Tela, Vol. 44, No. 4, 2002, pp. 700–704.
Original Russian Text Copyright © 2002 by Voronkov, Voronkova, Batunina, Golovina, Arapkina, Tyurina, Gulyaeva, Mil’vidski\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \).
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Voronkov, V.V., Voronkova, G.I., Batunina, A.V. et al. Shallow thermal donors in nitrogen-doped silicon single crystals. Phys. Solid State 44, 727–731 (2002). https://doi.org/10.1134/1.1470566
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DOI: https://doi.org/10.1134/1.1470566