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The fractal properties of a geometric model of the high-resolution X-ray diffractor

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Abstract

Perfect and mosaic crystals are conventionally used in X-ray monochromators operating in the energy range from several hundred to tens of thousands of electronvolts. The focusing X-ray optics for nonparallel beams employs either cylindrical bent crystals (the methods of Johann [1], Johansson [2], and Cauchois [3]) or crystals with spherical or toroidal [4] bending of the crystallographic planes. Special variants of high-resolution stepped-crystal diffractors [5–8] were developed to study the possibility of high-precision focusing of a monochromatic X-ray radiation. The fractal properties of a geometric model of such a high-resolution steppedcrystal diffractor are considered.

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Authors and Affiliations

  1. Faculty of Physics, Rostov State University, Rostov-on-Don, Russia

    E. M. Latush & M. I. Mazuritsky

Authors
  1. E. M. Latush
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  2. M. I. Mazuritsky
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Translated from Pis’ma v Zhurnal Tekhnichesko\(j_k \sim 1/\sqrt[4]{\tau }\) Fiziki, Vol. 27, No. 18, 2001, pp. 54–60.

Original Russian Text Copyright © 2001 by Latush, Mazuritsky.

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Latush, E.M., Mazuritsky, M.I. The fractal properties of a geometric model of the high-resolution X-ray diffractor. Tech. Phys. Lett. 27, 781–783 (2001). https://doi.org/10.1134/1.1407358

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  • DOI: https://doi.org/10.1134/1.1407358

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