Abstract
We have measured the absorption spectra and the dispersion of refractive index for porous silicon samples with different porosities in the energy range 1.5–3.5 eV at room temperatures. The experimental data are compared with the dependences calculated by using Bruggeman’s theory for the dielectric constant of a multicomponent system composed of crystal silicon, SiO2, amorphous silicon, and voids (pores). The best agreement between the experimental and theoretical dependences is achieved for a significant percentage of SiO2 in the porous silicon samples.
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Translated from Zhurnal Éksperimental’no\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \) i Teoretichesko\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \) Fiziki, Vol. 120, No. 2, 2001, pp. 409–419.
Original Russian Text Copyright © 2001 by Strashnikova, Vozny\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \), Reznichenko, Ga\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \)voronski\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \).
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Strashnikova, M.I., Voznyi, V.L., Reznichenko, V.Y. et al. Optical properties of porous silicon. J. Exp. Theor. Phys. 93, 363–371 (2001). https://doi.org/10.1134/1.1402736
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DOI: https://doi.org/10.1134/1.1402736