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Specular x-ray reflection from a crystal coated with an amorphous film under the conditions for strongly asymmetric noncoplanar diffraction

  • Low-Dimensional Systems and Surface Physics
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Abstract

The angular dependence of the intensity of specularly reflected x-rays from a crystal coated with an amorphous film under the conditions for glancing noncoplanar diffraction is rigorously analyzed theoretically. The anomalous angular dependence is shown to be very sensitive to the presence of thin amorphous films several nanometers thick. The optimum conditions for recording are realized at glancing angles of 1.5–4 times the critical angle for total external reflection.

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Translated from Fizika Tverdogo Tela, Vol. 43, No. 5, 2001, pp. 906–912.

Original Russian Text Copyright © 2001 by Bushuev, Oreshko.

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Bushuev, V.A., Oreshko, A.P. Specular x-ray reflection from a crystal coated with an amorphous film under the conditions for strongly asymmetric noncoplanar diffraction. Phys. Solid State 43, 941–948 (2001). https://doi.org/10.1134/1.1371382

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  • DOI: https://doi.org/10.1134/1.1371382

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