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Measuring the parameters of photorefractive crystals by an electrooptical compensation method

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Abstract

A new compensation method, based on the longitudinal electrooptical effect in a modified Pockels cell accommodating two crystal plates instead of a single plate, is proposed for measuring the parameters of photorefractive crystals. The plates are oriented so that their surfaces are perpendicular to the optical axis and the long semiaxes of the electric-field-induced birefringence ellipsoids are rotated 90° relative to one another around this axis. The proposed method was used to measure the Maxwell relaxation time in the Bi12SiO20:Al crystal (0.2% Al) as a function of the photoexcitation intensity I ex in the green-blue spectral region (λ=5145 Å). For I ex=10 mW/cm2, the Maxwell relaxation time decreases by 6±1 s as compared to the dark value (80±10 s).

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References

  1. M. P. Petrov, S. I. Stepanov, and A. V. Khomenko, Photorefractive Crystals in Coherent Optical Systems (Springer-Verlag, Berlin, 1991).

    Google Scholar 

  2. V. N. Astratov, A. S. Furman, and A. V. Ilinski, in Semiconductors and Insulators: Optical and Spectroscopic Research, Ed. by Yu. I. Koptev (New York, 1992), p. 271.

  3. A. V. Ilinskii, I. Velázquez-Cruz, T. A. Prutskij, et al., in Proceedings of the II International Workshop “Optoelectronic Materials and Their Applications (Including Solar Cells),” La Habana, Cuba, 1998, p. 314.

  4. M. Born and E. Wolf, Principles of Optics (Pergamon, Oxford, 1969; Nauka, Moscow 1973).

    Google Scholar 

  5. G. Ya. Mirskii, Radioelectronic Measurements (Moscow, 1975).

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Authors and Affiliations

  1. Benemerita Universidad Autonoma de Puebla, México City, México

    A. V. Ilinskii

  2. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. Petersburg, 194021, Russia

    E. B. Shadrin

Authors
  1. A. V. Ilinskii
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  2. E. B. Shadrin
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Translated from Pis’ma v Zhurnal Tekhnichesko\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \) Fiziki, Vol. 27, No. 3, 2001, pp. 54–58.

Original Russian Text Copyright © 2001 by Ilinskii, Shadrin.

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Ilinskii, A.V., Shadrin, E.B. Measuring the parameters of photorefractive crystals by an electrooptical compensation method. Tech. Phys. Lett. 27, 112–113 (2001). https://doi.org/10.1134/1.1352764

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  • DOI: https://doi.org/10.1134/1.1352764

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