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Measurement of scintillator parameters using pulsed X-ray excitation

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Abstract

A setup for measurement of the major scintillator parameters, including decay time constants, light yield, and emission spectrum, has been developed. It consists of three main components: a small-size source of short X-ray pulses, a cryostat, and a registration system. The ultimate parameters characterizing the source are as follows: pulse duration, ∼0.5 ns; repetition rate, 100 kHz; X-ray tube voltage, 30 kV; and current amplitude, 0.5 A. The registration system allows the measurements to be carried out in the 200–800 nm spectral range over the time intervals from 0.5 ns to 50 μs with resolution not worse than 0.1 ns.

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Authors and Affiliations

  1. St. Petersburg State Technical University, St. Petersburg, 195251, Russia

    P. A. Rodnyi, S. B. Mikhrin & A. N. Mishin

Authors
  1. P. A. Rodnyi
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  2. S. B. Mikhrin
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  3. A. N. Mishin
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Translated from Pis’ma v Zhurnal Tekhnichesko\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \) Fiziki, Vol. 26, No. 15, 2000, pp. 72–79.

Original Russian Text Copyright © 2000 by Rodny\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \), Mikhrin, Mishin.

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Rodnyi, P.A., Mikhrin, S.B. & Mishin, A.N. Measurement of scintillator parameters using pulsed X-ray excitation. Tech. Phys. Lett. 26, 678–681 (2000). https://doi.org/10.1134/1.1307811

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  • DOI: https://doi.org/10.1134/1.1307811

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