Skip to main content
SpringerLink
Log in

Atomic force microscope in a contactless mode: Peculiarities of force interactions

  • Published:
Technical Physics Letters Aims and scope Submit manuscript

Abstract

Forces of interaction between the atomic force microscope (AFM) probe and the surface of a solid are calculated with an allowance for the induced cantilever oscillations. A continuous approximation used in this work does not take into account discreteness of the sample and probe structures. Calculations have been performed for various AFM point shapes. It is theoretically demonstrated that the cantilever oscillations increase the interaction force.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. V. S. Édel’man, Prib. Tekh. Éksp., No. 5, 25 (1989).

  2. V. S. Édel’man, Prib. Tekh. Éksp., No. 1, 24 (1991).

  3. S. Sh. Rekhviashvili and G. V. Dedkov, in “Proceedings of the Scientific Seminar Noise and Degradation Processes in Semiconductor Devices (Metrology, Diagnostics, and Technology)” (Mosk. Nauch.-Tekh. O-vo Radioélektr. Svyazi im. A. S. Popova, Mosk. Énerg. Inst., Moscow, 1998), pp. 205–209.

    Google Scholar 

  4. U. Hartmann, Phys. Rev. B 42, 1541 (1990).

    Article  ADS  Google Scholar 

  5. H. Buttner and E. Gerlach, Chem. Lett. 5(2), 91 (1970).

    ADS  Google Scholar 

  6. E. M. Lifshitz and L. P. Pitaevskii, Statistical Physics (Nauka, Moscow, 1978).

    Google Scholar 

  7. G. V. Dedkov and S. Sh. Rekhviashvili, Zh. Tekh. Fiz. 69(8), 124 (1990) [Tech. Phys. 44, 982 (1999)].

    Google Scholar 

  8. Yu. M. Moiseev, V. M. Mostepanenko, V. I. Panov, et al., Zh. Tekh. Fiz. 60(1), 141 (1990) [Sov. Phys. Tech. Phys. 35, 84 (1990)].

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Institute of Applied Mathematics and Automation, Kabardino-Balkarian Scientific Center, Russian Academy of Sciences, Nalchik

    S. Sh. Rekhviashvili

Authors
  1. S. Sh. Rekhviashvili
    View author publications

    You can also search for this author in PubMed Google Scholar

Additional information

__________

Translated from Pis’ma v Zhurnal Tekhnichesko\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l}\) Fiziki, Vol. 26, No. 12, 2000, pp. 46–50.

Original Russian Text Copyright © 2000 by Rekhviashvili.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Rekhviashvili, S.S. Atomic force microscope in a contactless mode: Peculiarities of force interactions. Tech. Phys. Lett. 26, 517–519 (2000). https://doi.org/10.1134/1.1262896

Download citation

  • Received:

  • Issue Date:

  • DOI: https://doi.org/10.1134/1.1262896

Keywords

Search

Navigation