Skip to main content
SpringerLink
Log in

Simulation of the stepped surface of a high-resolution X-ray diffractor

  • Published:
Technical Physics Letters Aims and scope Submit manuscript

Abstract

Three possible schemes of a high-resolution stepped X-ray diffractor have been analyzed, including those based on the steps of equal angular widths, the steps of equal heights (i.e., distances from the step edge to the beginning of the next step), and the symmetric steps (where a distance from the step edge to the focusing circumference is equal to the distance from the focusing circumference to the edge of the next step). It is shown that the first and the third schemes provide most stable characteristics.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. C. Bonnelle and C. Mande, Advances in X-ray Spectroscopy (Pergamon, New York, 1982).

    Google Scholar 

  2. A. K. Freund, X-ray Optics (ESRF, Grenoble, 1987).

    Google Scholar 

  3. A. G. Michette, Optical System for Soft X-ray (Plenum, New York, 1986).

    Google Scholar 

  4. J. W. M. DuMond and A. Kirpatrick, Rev. Sci. Instrum. 1, 88 (1930).

    Google Scholar 

  5. H. H. Johann, Z. Phys. 69, 185 (1931).

    ADS  Google Scholar 

  6. Y. Cauchois, J. Phys. Radium 3, 320 (1932).

    Google Scholar 

  7. I. Von Hamos, Naturwissenschaften 20, 705 (1932).

    Google Scholar 

  8. T. Johannson, Z. Phys. 82, 507 (1933).

    ADS  Google Scholar 

  9. D. B. Wittry and S. J. Sun, Appl. Phys. 69, 3886 (1991).

    Google Scholar 

  10. A. Marcelli, A. V. Soldatov, and M. I. Mazuritsky, European Patent No. 97830282.6-2208, deposited by INFN on 06/11/97, published on 12/16/98.

  11. A. Marcelli, M. I. Mazuritsky, and A. V. Soldatov, Proc. SPIE 3448, 210 (1998).

    ADS  Google Scholar 

  12. M. I. Mazuritsky, A. V. Soldatov, E. M. Latush, et al., Pis’ma Zh. Tekh. Fiz. 25(19), 11 (1999) [Tech. Phys. Lett. 25, 763 (1999)].

    Google Scholar 

  13. Working variant of the program written in the DELPHI medium can be found at: http://www.projectx.aaanet.ru.

Download references

Author information

Authors and Affiliations

  1. Rostov State University, Rostov, Russia

    M. I. Mazuritsky, E. M. Latush, A. V. Soldatov, G. A. Ugol’nitskii, V. L. Lyashenko & A. Marcelli

Authors
  1. M. I. Mazuritsky
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. E. M. Latush
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. A. V. Soldatov
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. G. A. Ugol’nitskii
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. V. L. Lyashenko
    View author publications

    You can also search for this author in PubMed Google Scholar

  6. A. Marcelli
    View author publications

    You can also search for this author in PubMed Google Scholar

Additional information

__________

Translated from Pis’ma v Zhurnal Tekhnichesko\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l}\) Fiziki, Vol. 26, No. 12, 2000, pp. 15–22.

Original Russian Text Copyright © 2000 by Mazuritsky, Latush, Soldatov, Ugol’nitski\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l}\), Lyashenko, Marcelli.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Mazuritsky, M.I., Latush, E.M., Soldatov, A.V. et al. Simulation of the stepped surface of a high-resolution X-ray diffractor. Tech. Phys. Lett. 26, 502–504 (2000). https://doi.org/10.1134/1.1262891

Download citation

  • Received:

  • Issue Date:

  • DOI: https://doi.org/10.1134/1.1262891

Keywords

Search

Navigation