Abstract
The conductance switching effect in an ytterbium oxide insulating film on silicon is investigated by the methods of scanning probe microscopy. A combined atomic force microscope and conductivity probe is used to create and visualize a single conducting microchannel in an insulating film. The position of the channel is compared with an image of the surface topography of the insulator taken at the same time.
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Pis’ma Zh. Tekh. Fiz. 24, 21–24 (June 26, 1998)
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Baiburin, V.B., Volkov, Y.P. & Rozhkov, V.A. Conducting microchannels in an ytterbium oxide insulating film. Tech. Phys. Lett. 24, 463–464 (1998). https://doi.org/10.1134/1.1262147
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DOI: https://doi.org/10.1134/1.1262147