Abstract
It is proposed that the C60 molecule be used as the imaging element of the tip of an atomic force microscope. Test computer images are obtained of portions of a distorted graphite surface and a graphite surface with vacancies.
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Pis’ma Zh. Tekh. Fiz. 23, 37–43 (June 26, 1997)
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Dedkov, G.V. Fullerenes as the imaging element of the tip of an atomic force microscope. Tech. Phys. Lett. 23, 469–471 (1997). https://doi.org/10.1134/1.1261721
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DOI: https://doi.org/10.1134/1.1261721