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Influence of local pressure on the current-voltage characteristic of Au-Si〈Ni〉-Sb structures

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Abstract

Results of an investigation of the influence of local pressure on the current-voltage characteristic of Au-Si〈Ni〉-Sb structures are presented for the first time. It is shown that nickel impurities in the silicon increase the total strain sensitivity n-Si〈Ni〉 structures.

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References

  1. A. Abduraimov, S. Z. Zainabidinov, O. O. Mamatkarimov, and I. G. Tursunov, Uzbek. Fiz. Zh. No. 4, 68 (1992).

  2. A. Abduraimov, S. Z. Zainabidinov, O. O. Mamatkarimov, Fiz. Tekh. Poluprovodn. 27, 1216 (1993) [Semiconductors 27, 671 (1993)].

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Authors and Affiliations

  1. Ulugbek State University, Tashkent

    O. O. Mamatkarimov

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  1. O. O. Mamatkarimov
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Pis’ma Zh. Tekh. Fiz. 23, 62–64 (May 12, 1997)

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Mamatkarimov, O.O. Influence of local pressure on the current-voltage characteristic of Au-Si〈Ni〉-Sb structures. Tech. Phys. Lett. 23, 360–361 (1997). https://doi.org/10.1134/1.1261680

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  • DOI: https://doi.org/10.1134/1.1261680

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