Abstract
The degradation of photoluminescence of porous silicon by kilovolt electrons and the mechanism and activation energy of this process have been investigated. Quantitative relations between the integral intensity of the photoluminescence and the irradiation dose and substrate temperature are obtained. The mechanism of the process is discussed and its activation energy is determined.
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Pis’ma Zh. Tekh. Fiz. 23, 44–50 (September 26, 1997)
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Kostishko, B.M., Orlov, A.M. & Frolov, V.A. Activation energy of electron-stimulated quenching of the photoluminescence of n-type porous silicon. Tech. Phys. Lett. 23, 714–716 (1997). https://doi.org/10.1134/1.1261665
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DOI: https://doi.org/10.1134/1.1261665