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Deposition of thick YBa2Cu3O7−x films on sapphire with a sublayer of cerium oxide

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Abstract

A report is made on the results of experiments to prepare YBa2Cu3O7−x films up to 2.6 μm thick on Al2O3/CeO2 with good structural perfection and electrophysical parameters.

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Authors and Affiliations

  1. St. Petersburg State Electrical Engineering University, St. Petersburg

    E. K. Hollmann, V. I. Gol’drin, V. E. Loginov, D. A. Plotkin, S. V. Razumov & A. V. Tumarkin

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  1. E. K. Hollmann
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  2. V. I. Gol’drin
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  3. V. E. Loginov
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  4. D. A. Plotkin
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  5. S. V. Razumov
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  6. A. V. Tumarkin
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Additional information

Pis’ma Zh. Tekh. Fiz. 23, 39–43 (March 12, 1997)

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Hollmann, E.K., Gol’drin, V.I., Loginov, V.E. et al. Deposition of thick YBa2Cu3O7−x films on sapphire with a sublayer of cerium oxide. Tech. Phys. Lett. 23, 186–187 (1997). https://doi.org/10.1134/1.1261642

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  • DOI: https://doi.org/10.1134/1.1261642

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